2011

International Conference

[1] Takahiro Ando, Shinji Kawasaki, Eun-Hye Choi, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshioka, Keisuke Shimatani, Munekazu Furuichi, and Osamu Mizuno, "Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --", Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings, November 2011. (Hiroshima, Japan)